TEST QUALITY ASSESSMENT BASED ON SMALL DELAY DEFECTS

Abstract

The quality of delay testing focused on small delay defects is not known when transition fault model is used. The paper presents a method that evaluates the quality of the delay test according to the covered paths of the circuit and constructs the paths, which could be used as the input to the path delay test generator. All the constructed paths are testable. The complexity of the circuit has no direct impact on the path construction. The path construction is based on the information provided by TetraMAX transition fault simulator. The transition fault simulator forms a text file that contains the complete information on the propagation of the transitions along the lines of the circuit. The experimental results demonstrate the ability to assess the quality of the delay test according to the covered paths.